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Certified according to ISO 9001
Analytical informations |
Analytical informations
Which informations do the methods provide ?
Methods of modern surface and thin-film analysis are able to image structures down to the nm-scale or to analyse trace amounts of organic compounds in smallest defect areas. |
| According to your special problem we carry out investigations on: |
| Determination of the chemical composition |
| Material charakterization and identification |
| Determination of the composition of multilayer systems |
| Imaging the topography and micro-/nano-structure |
