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Certified according to ISO 9001
Analytical methods: TOF-SIMS - FTIR - REM/EDX - TEM - AFM - XPS (ESCA) - AES - GDOS - SNMS - XRD - LIGHT MICROSCOPY
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Surface, interface and |
| micro analysis |
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Characterisation of materials |
| and coatings |
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Failure analysis in production, |
| development and quality management |
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